Evaluation of threading dislocation density of strained Ge epitaxial layer by high resolution x-ray diffraction
Miao Yuan-Hao †, Hu Hui-Yong ‡, Li Xin, Song Jian-Jun, Xuan Rong-Xi, Zhang He-Ming
       

(color online) –ω scans of samples A (a) A and B (b) measured by HR-XRD.