Effects of rapid thermal annealing on crystallinity and Sn surface segregation of

films on Si (100) and Si (111)

Miao Yuan-Hao^†,, Hu Hui-Yong^‡,, Song Jian-Jun, Xuan Rong-Xi, Zhang He-Ming

(color online) Sn surface compositions and Sn bulk compositions measured by XPS and XRD as a function of annealing temperature for samples A and B.