Effects of rapid thermal annealing on crystallinity and Sn surface segregation of

films on Si (100) and Si (111)

Miao Yuan-Hao^†,, Hu Hui-Yong^‡,, Song Jian-Jun, Xuan Rong-Xi, Zhang He-Ming

(color online) AFM surface scans ( ) of the samples annealed at various temperatures for 30 s.