Segregations and desorptions of Ge atoms in nanocomposite Si1−xGex films during high-temperature annealing
EDS and XPS measured Ge atomic compositions as a function of 
Segregations and desorptions of Ge atoms in nanocomposite Si1−xGex films during high-temperature annealing |
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EDS and XPS measured Ge atomic compositions as a function of |
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