Angular-modulated spatial distribution of ultrahigh-order modes assisted by random scattering
Kan Xue-Fen1, Yin Cheng1, 2, †, Xu Tian3, Chen Fan4, Li Jian1, Han Qing-Bang1, Chen Xian-Feng2
       

Numerical simulated reflectivities in ranges of [0°, 3°] and [18°, 20°], respectively. The parameters in the simulation are given as follows: the silver film thickness is dag = 30 nm, the thickness values of the two layers in the guiding layers are dglass = 30 mm and dair = 0.7 mm, respectively, the incident wavelength is 785 nm, and the dielectric constants are εag = −23.82 + 1.78i, εglass = 2.283, respectively.