Structural, optical, and electrical properties of Cu-doped ZrO2 films prepared by magnetron co-sputtering Project supported by the National Natural Science Foundation of China (Grant Nos. 51272224 and 11164031) |
Scanning electron microscopy (SEM) images of the Cu-doped ZrO2 films formed at Cu content of (a) 0 at.%; (b) 5.93 at.%; (c) 7.18 at.%, and (d) 8.07 at.%. |