Damage threshold influenced by polishing imperfection distribution under 355-nm laser irradiation

Yu Zhen^{1, 2}, Qi Hong-Ji^{1, †}, Zhang Wei-Li¹, Wang Hu^{1, 2}, Wang Bin^{1, 2}, Wang Yue-Liang^{1, 2}, Huang Hao-Peng^{1, 2}

(color online) Size versus threshold curve (red) fitting with the original in Fig. 2 (black), ruled by Eq. (5) below a radius of 60 nm.