Performance enhancement of CMOS terahertz detector by drain current
Zhang Xingxing, Ji Xiaoli, Liao Yiming, Peng Jingyu, Zhu Chenxin, Yan Feng
       

(color online) Measured SV of detectors under the condition for Rv,max. The dashed lines represent the fitting obtained using the noise model, considering the thermal noise and Gr noise source.