A synthetic semi-empirical physical model of secondary electron yield of metals under E-beam irradiation
Feng Guo-Bao1, 2, Cui Wan-Zhao1, †, Zhang Na1, Cao Meng2, Liu Chun-Liang2
       

(color online) (a) Schematic of SE measurement system; (b) comparation of SEY of the simulation with experimental data, by using the Joy and Vaughan’s model.