Tungsten ion source under double-pulse laser ablation system |
(color online) Gate delay dependence of the normalized emission intensities of W(I) 361.75 nm line by focusing the DP-lasers at various distances relative to the tungsten surface (d = −2.5 mm, −1 mm front of the surface, 0, 3 mm, and 4 mm behind the surface) recorded in air. |