Tungsten ion source under double-pulse laser ablation system
Khalil Ahmed Asaad I1, †, Hafez Ashraf I2, Elgohary Mahmoud E3, 4, Morsy Mohamed A5
       

(color online) Gate delay dependence of the normalized emission intensities of W(I) 361.75 nm line by focusing the DP-lasers at various distances relative to the tungsten surface (d = −2.5 mm, −1 mm front of the surface, 0, 3 mm, and 4 mm behind the surface) recorded in air.