A generalized model of TiOx-based memristive devices and its application for image processing
Zhang Jiangwei1, 2, 3, Tang Zhensen1, 2, Xu Nuo1, 2, 4, Wang Yao2, Sun Honghui1, 2, Wang Zhiyuan1, 2, Fang Liang1, 2, †
       

(color online) A comparison of LTP/LTD responses between simulation results and experimental data of HfOx device under trains of identical rectangular spikes described in Ref. [38]. Potentiation: voltage amplitude 0.55 V, time width , rise and fall times 100 ns. Depression: voltage amplitude −0.7 V, time width , rise and fall times 100 ns.