Direct characterization of boron segregation at random and twin grain boundaries<sup>

Direct characterization of boron segregation at random and twin grain boundaries

Li Xiang-Long^¹, Wu Ping^{¹, †}, Yang Rui-Jie^¹, Zhang Shi-Ping^¹, Chen Sen^¹, Wang Xue-Min^², Huai Xiu-Lan^³

(color online) Microstructures of the analyzed TBs (row 1) and boron segregations characterised by SIMS (row 2) in the samples deformed at different temperatures. The possible measured areas are shown by black rectangles in the optical microscope images in row 1.