Direct characterization of boron segregation at random and twin grain boundaries<sup>

Direct characterization of boron segregation at random and twin grain boundaries

Li Xiang-Long^¹, Wu Ping^{¹, †}, Yang Rui-Jie^¹, Zhang Shi-Ping^¹, Chen Sen^¹, Wang Xue-Min^², Huai Xiu-Lan^³

(color online) Microstructures of the analyzed random GBs (row 1) and boron distribution characterized by SIMS (row 2) in the samples deformed at different temperatures. The marked random grain boundaries are shown in Fig. 1 by long white arrows. The two types of segregations are indicated by red and white arrows, respectively in Figs. 1(b) and 1(d). The possible measured areas are shown by black rectangles in the optical microscope images in row 1.