Surface enhancement of molecular ion H<sub>2</sub><sup>+</sup> yield in a 2.45-GHz electron-cyclotron resonance ion source

Surface enhancement of molecular ion H₂⁺ yield in a 2.45-GHz electron-cyclotron resonance ion source

Xu Yuan¹, Peng Shi-Xiang^{1, †}, Ren Hai-Tao¹, Zhang Ai-Lin^{1, 2}, Zhang Tao¹, Zhang Jing-Feng¹, Wen Jia-Mei¹, Wu Wen-Bin¹, Guo Zhi-Yu¹, Chen Jia-Er^{1, 2}

(color online) Roughness of sample surfaces under different discharge conditions.