Plasmonic Mach–Zehnder interferometric sensor based on a metal–insulator-metal nanostructure
Shen Meng, Wang Ming, Du Lan, Pan Ting-Ting
       

(color online) (a) Interference spectra for MIM-MZIs with increasing core layer thicknesses of 100 nm, 150 nm, and 200 nm. (b) Calculated electric field distributions , , and at the interference peak and valley wavelengths.