Electronic structure & yield strength prediction for dislocation–Mo complex in the <i>γ</i> phase of nickel-based superalloys

Electronic structure & yield strength prediction for dislocation–Mo complex in the γ phase of nickel-based superalloys

Liu Feng-Hua¹, Wang Chong-Yu^{1, 2, †}

(color online) Temperature dependence of CRSS under the strain rates of s⁻¹ (black line) and s⁻¹ (red line), respectively.