Different angle-resolved polarization configurations of Raman spectroscopy: A case on the basal and edge plane of two-dimensional materials<xref rid="cpb_26_6_067802fn1" ref-type="fn">*</xref> <fn id="cpb_26_6_067802fn1"> <label>*</label> <p>Project supported by the National Key Research and Development Program of China (Grant No. 2016YFA0301204) and the National Natural Science Foundation of China (Grant Nos. 11604326, 11434010, 11474277, and 11225421).</p> </fn>

Different angle-resolved polarization configurations of Raman spectroscopy: A case on the basal and edge plane of two-dimensional materials* *

Project supported by the National Key Research and Development Program of China (Grant No. 2016YFA0301204) and the National Natural Science Foundation of China (Grant Nos. 11604326, 11434010, 11474277, and 11225421).

Liu Xue-Lu^{1, 2}, Zhang Xin^{1, 2}, Lin Miao-Ling^{1, 2}, Tan Ping-Heng^{1, 2, †}

(color online) (a) Raman spectrum of HOPG at the edge plane with incident laser and analyzer polarization along the axis. Inset shows schematic image of the edge plane for Raman measurement. (b) Polar plot of the G mode intensity at the edge plane ( ) as a function of laser polarization angle for configurations of and . (c) Polar plot of as a function of sample rotation angle for configurations of and . (d) Polar plot of as a function of laser polarization angle for configurations of and . The dash curves are the fitted results.