Huang Ce1, 2, Zhang Enze1, 2, Yuan Xiang1, 2, Wang Weiyi1, 2, Liu Yanwen1, 2, Zhang Cheng1, 2, Ling Jiwei1, 2, Liu Shanshan1, 2, Xiu Faxian1, 2, 3, †
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(color online) CDW transitions in a
nm thick and 15-nm thin TiS
nanoribbon. (a) The temperature dependence of the resistance and the logarithmic derivative
. The source–drain current
nA. Three CDW transitions are evident at 29, 53, and 103 K. Inset: optical microscopy image of the 50 nm–60 nm TiS3 FET. (b)
–
curves of the thick TiS3 nanoribbon at different temperatures. (c) The temperature dependence of parameter
using different fitting region. The red curve is fitted at
V, while the blue one is at
V. The inset shows the two fitting regions. (d) Temperature dependence of the resistance and the logarithmic derivative
in a device whose thickness is lower than 15 nm. The source drain current
nA. Unlike the thick nanoribbon, two CDW transitions appear at 46 K and 85 K. Inset: optical image of the FET device.
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