Effect of driving frequency on the structure of silicon grown on Ag (111) films by very-high-frequency magnetron sputtering*

Project supported by the National Natural Science Foundation of China (Grant Nos. 11675118 and 11275136).

Guo Jia-Min1, Ye Chao1, 2, †, Wang Xiang-Ying3, Yang Pei-Fang1, Zhang Su3
       

(color online) Si 2p XPS peaks and their Gaussian deconvolutions of the silicon grown on Ag (111) films sputtered at (a) 40.68 MHz and (b) 60 MHz, respectively.