Modeling and understanding of the thermal failure induced by high power microwave in CMOS inverter
Zhang Yu-Hang, Chai Chang-Chun, Liu Yang, Yang Yin-Tang, Shi Chun-Lei, Fan Qing-Yang, Liu Yu-Qian
       

Variations of simulated (empty square) damage power and energy threshold with width, and their comparisons with their counterparts of reported data (empty triangle).