Structural stability of ultra-high temperature refractory material MoSi2 and Mo5Si3 under high pressure
Liang Hao1, Peng Fang1, †, Fan Cong1, Zhang Qiang1, Liu Jing2, Guan Shi-Xue1
       

(color online) X-ray diffraction patterns (λ = 0.6199 Å) of the sample under various pressures at room temperature. The five-pointed star represents the diffraction peak of MoSi2 and the rhombus represents the diffraction peak of Mo5Si3. (a) The diffraction patterns of MoSi2 and Mo5Si3 upon compression to the highest pressure of 41.1 GPa. (b) Rietveld refinement pattrens of the specimen about 4.9 GPa. Red line: calculated curve, black short lines: Bragg position, forks type: experimental curve, blue lines: difference curve.