A novel enhancement mode AlGaN/GaN high electron mobility transistor with split floating gates
Wang Hui1, 2, Wang Ning1, 2, Jiang Ling-Li1, 2, Lin Xin-Peng1, 2, Zhao Hai-Yue1, 2, Yu Hong-Yu1, 2, †
       

(color online) as a function of for the single FG. The , nm, and nm. The TD and BD are both SiO2.