Investigation of the surface orientation influence on 10-nm double gate GaSb nMOSFETs
Di Shaoyan
1
, Shen Lei
1
, Lun Zhiyuan
1
, Chang Pengying
1
, Zhao Kai
1, 3, †
, Lu Tiao
2
, Du Gang
1
, Liu Xiaoyan
1, ‡
(color online) The
I
D
–
V
G
curves of the simulated devices with (100) and (111) surface orientations.