Modeling and analysis for the image mapping spectrometer
Yuan Yan, Ding Xiao-Ming, Su Li-Juan, Wang Wan-Yue
       

(color online) The PRFs at (a) 450 nm, (b) 600 nm, and (c) 750 nm. Panels (d), (e), and (f) show the PRF curves of panels (a), (b), and (c), respectively and the full width at half maximum (FWHM) of each curve.