Modeling and analysis for the image mapping spectrometer
Yuan Yan, Ding Xiao-Ming, Su Li-Juan, Wang Wan-Yue
       

(color online) The of the fore optics at (a) 450 nm, (b) 600 nm, and (c) 750 nm, respectively; the PRF curves ((d), (e), and (f)) for panels (a), (b), and (c), respectively.