Dislocation distributions and tilts in Al(Ga)InAs reverse-graded layers grown on misorientated GaAs substrates
Symmetric (004) RSM of (a) sample A and (b) sample B with projection of the incident beam on (001) surface along the [1-10] direction.
Dislocation distributions and tilts in Al(Ga)InAs reverse-graded layers grown on misorientated GaAs substrates |
Symmetric (004) RSM of (a) sample A and (b) sample B with projection of the incident beam on (001) surface along the [1-10] direction. |
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