Dislocation distributions and tilts in Al(Ga)InAs reverse-graded layers grown on misorientated GaAs substrates
FWHMs of the symmetric (004) rocking curves of samples A and B with the incident x-ray beam along the [110] and [1-10] directions.
Dislocation distributions and tilts in Al(Ga)InAs reverse-graded layers grown on misorientated GaAs substrates |
FWHMs of the symmetric (004) rocking curves of samples A and B with the incident x-ray beam along the [110] and [1-10] directions. |
| |