Band structure of silicon and germanium thin films based on first principles*

Project supported by the National Natural Science Foundation of China (Grant Nos. 11264007 and 61465003).

Wu Xue-Ke1, 2, Huang Wei-Qi2, †, Huang Zhong-Mei3, Qin Chao-Jian4, Dong Tai-Ge2, Wang Gang2, Tang Yan-Lin2, ‡
       

(color online) PL spectra in infrared wavelength measured on superlattice structure of Si–Ge layers in (111) direction at 20K.