Investigation on latch-up susceptibility induced by high-power microwave in complementary metal–oxide

Investigation on latch-up susceptibility induced by high-power microwave in complementary metal–oxide–semiconductor inverter

Zhang Yu-Hang^†, Chai Chang-Chun, Yu Xin-Hai, Yang Yin-Tang, Liu Yang, Fan Qing-Yang, Shi Chun-Lei

(color online) Semi-logarithmic electron density distributions as a function of lateral position x at depth of 1 μm and their variations with time for .