Investigation on latch-up susceptibility induced by high-power microwave in complementary metal–oxide–semiconductor inverter
Zhang Yu-Hang
†
, Chai Chang-Chun
, Yu Xin-Hai
, Yang Yin-Tang
, Liu Yang
, Fan Qing-Yang
, Shi Chun-Lei
Schematic diagram of CMOS inverter with a parasitic p–n–p–n structure.