On the reverse leakage current of Schottky contacts on free-standing GaN at high reverse biases
Lei Yong, Su Jing, Wu Hong-Yan, Yang Cui-Hong, Rao Wei-Feng
       

(color online) Simulated reverse IV curves (solid line) along with the experimental curves (symbol line) at temperatures ranging from 300 K to 450 K. The inset shows the schematic diagram of the Schottky barrier diode fabricated on n-bulk GaN substrate.