Random telegraph noise on the threshold voltage of multi-level flash memory

Liao Yiming¹, Ji Xiaoli^{1, †}, Xu Yue³, Zhang Chengxu¹, Guo Qiang², Yan Feng¹

(color online) The – curves for RTN amplitude ( ) extraction. Due to an electron trapped/de-trapped in the tunnel oxide trap, a RTN event may occur at time t and the value of can be extracted based on the equation of