Cao Binglei1, 2, Jian Jikang1, †, Ge Binghui2, Li Shanming2, Wang Hao2, Liu Jiao1, Zhao Huaizhou2, ‡
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(color online) Transmission electron microscopy (TEM) and energy dispersion x-ray spectrometry (EDX) mapping images of Bi
Sb
Te
with 2 mol% of MnSb
Se
(column A) and with 2 mol% of Mn
Cu
Sb
Se
(column B), respectively. (a1) a low-magnification TEM image of the sample, with the main body as Bi
Sb
Te
and the black spot corresponding to the second phase; (a2) a grain boundary TEM image of the sample; (a3) a HRTEM image of the sample matrix, the images on the right side of TEM graphs are the EDS mapping of areas in panel (a2). (b1, b2) low-magnification TEM images of the sample, with the main phase as Bi
Sb
Te
and the spot corresponding to the second phase; (b3) a high-magnification TEM image of the sample; (b4) a HRTEM image of the sample matrix, with the images on the right side of the TEM images showing the EDS mapping images of the area in panel (b3).
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