Studies on the nucleation of MBE grown III-nitride nanowires on Si |
(color online) (a) A cross-section HRTEM image of the base area of a single AlN NW. (b) A Fourier filtered image of the AlN NW in the area marked by the red square in panel (a), the c (002) plane distances in the lower part and the upper part are measured to be 4.66 Å and 4.94 Å, respectively. |