Investigations of thickness-shear mode elastic constant and damping of shunted piezoelectric materials with a coupling resonator

Hu Ji-Ying¹, Li Zhao-Hui^{1, †,}, Sun Yang^{1, 3}, Li Qi-Hu²

Electrical conductances of the system measured from the two electrodes of wafer a by experiments with b shunted to: (a1) a resistor (experiment); (a2) a resistor (FEM); (b1) a capacitor (experiment); (b2) a resistor (FEM); (c1) an inductor (experiment); (c2) an inductor (FEM).