Coexistence of unipolar and bipolar modes in Ag/ZnO/Pt resistive switching memory with oxygen-vacancy and metal-Ag filaments

Ma Han-Lu, Wang Zhong-Qiang^†,, Xu Hai-Yang^‡,, Zhang Lei, Zhao Xiao-Ning, Han Man-Shu, Ma Jian-Gang, Liu Yi-Chun

Cumulative probabilities of (a) V_set and V_reset, (b) I_reset, and (c) HRS and LRS in the URS and BRS modes, respectively.