Control of epitaxial growth at a-Si:H/c-Si heterointerface by the working pressure in PECVD
Shen Yanjiao
1
, Chen Jianhui
1, †,
, Yang Jing
1
, Chen Bingbing
1
, Chen Jingwei
1
, Li Feng
2
, Dai Xiuhong
1
, Liu Haixu
1
, Xu Ying
1
, Mai Yaohua
1, ‡,
Models used to analyze SE data of samples in this work.