Charge transport and bipolar switching mechanism in a Cu/HfO2/Pt resistive switching cell
Tan Tingting†, 
, Guo Tingting, Wu Zhihui, Liu Zhengtang
, Guo Tingting, Wu Zhihui, Liu Zhengtang The XPS depth profiles of the Hf 4f and Cu 2p3/2 at the Cu/HfO2 interface region. (a) Cu 2p3/2 peaks and (b) Hf 4f peaks.
