Current spreading in GaN-based light-emitting diodes
Li Qiang1, 2, Li Yufeng1, 2, Zhang Minyan2, Ding Wen1, 2, Yun Feng1, 2, †,
       

Relationship between IQE and current density in the case of changing various parameters. (a) Auger recombination is not considered. (b) Auger recombination is considered. Region I: 103–104; region II: 104–105; region III: 105–106.