High-reflectivity high-contrast grating focusing reflector on silicon-on-insulator wafer
Fang Wenjing1, 2, Huang Yongqing1, 2, †, 
, Duan Xiaofeng1, 2, Liu Kai1, 2, Fei Jiarui1, 2, Ren Xiaomin1, 2
, Duan Xiaofeng1, 2, Liu Kai1, 2, Fei Jiarui1, 2, Ren Xiaomin1, 2 Intensity of the focused spot, and the focal distance, for the reflected beam for TM versus wavelength for 1530–1580 nm. (a) Intensity. (b) Focal distance.
