Semi-analytical model for quasi-double-layer surface electrode ion traps

Zhang Jian¹, Chen Shuming^{1, 2, †,}, Wang Yaohua^{1, ‡,}

The pseudopotential along the y axis. Results are derived from the FEM simulation. The pseudopotential along the y axis constructs a trap for trapping ions. The trap depth is various in different types of ion traps.