Characteristics of cylindrical surrounding-gate GaAsxSb1−x/InyGa1−yAs heterojunction tunneling field-effect transistors
Guan Yun-He, Li Zun-Chao†, , Luo Dong-Xu, Meng Qing-Zhi, Zhang Ye-Fei
Curves of drain current versus gate voltage for different material compositions (x = 0.5, y = 0.53, Ebeff = 0.5 eV and x = 0.4, y = 0.65, Ebeff = 0.31 eV) in (dashed) linear and (solid) log scales at VDS = 0.5 V, NA = 1020 cm−3, and ND = 1018 cm−3.