Atomic-layer-deposited Al
2
O
3
and HfO
2
on InAlAs: A comparative study of interfacial and electrical characteristics
Wu Li-Fan
1, 2
, Zhang Yu-Ming
1
, Lv Hong-Liang
1, †,
, Zhang Yi-Men
1
Curves of
D
it
versus
E
t
–
E
i
for sample I: Al
2
O
3
/InAlAs and sample II: HfO
2
/InAlAs.