Magnetic, dielectric and magnetoelectric measurements. (a) Field-cooled temperature dependence of magnetization for sample 1. Magnetic field of 100 Oe is applied parallel to the film surface. (b) Field dependence of magnetization of the multilayer structure at 50 K for sample 1. (c) Temperature dispersion of the dielectric constant (ε) at different frequencies for sample 2. (d) Magnetic field induced variations of the dielectric constant at different temperatures and a frequency of 10 kHz for sample 2.