The spin Hall effect in single-crystalline gold thin films

Tian Dai^{1, 2}, Chen Caigan^{1, 2}, Wang Hua^{1, 2}, Jin Xiaofeng^{1, 2, †,}

(a) Resistivity ρ_xx of 10-nm thick poly-crystalline (black) and single-crystalline (red) Au film as a function of temperature. Upper inset: the schematic map of the 4-probe measurement configuration. Lower inset: the RHEED pattern of the annealed MgO substrate (left) and the single crystal Au film (right). (b) Temperature dependency of R_nl measured for devices of w = 70 nm with different crystal quality. Inset: schematic map of the non-local measurement.