Effects of Si surficial structure on transport properties of La<bold>2/3</bold>Sr<bold>1/3</bold>MnO<bold>3</bold> films

Effects of Si surficial structure on transport properties of La_2/3Sr_1/3MnO₃ films

Gu Xiao-Min¹, Wang Wei², Zhou Guo-Tai¹, Gao Kai-Ge¹, Cai Hong-Ling¹, Zhang Feng-Ming¹, Wu Xiao-Shan^{1, †,}

Plots of magnetoresistance (MR)–H loops at 5 K. The peak values of 28%, 32%, and 40% are obtained for s1, s2, and s3, respectively.