Effects of Si surficial structure on transport properties of La2/3Sr1/3MnO3 films
Gu Xiao-Min1, Wang Wei2, Zhou Guo-Tai1, Gao Kai-Ge1, Cai Hong-Ling1, Zhang Feng-Ming1, Wu Xiao-Shan1, †,
Plots of linear fittings lnR–T−1/2 for s1; lnR ∼ T−1 for s2 and s3 of three samples at low temperatures. (b) Variations of fitted residual resistance ρ0 and characteristic temperature T0 with magnetic field.