Effects of Si surficial structure on transport properties of La<bold>2/3</bold>Sr<bold>1/3</bold>MnO<bold>3</bold> films

Effects of Si surficial structure on transport properties of La_2/3Sr_1/3MnO₃ films

Gu Xiao-Min¹, Wang Wei², Zhou Guo-Tai¹, Gao Kai-Ge¹, Cai Hong-Ling¹, Zhang Feng-Ming¹, Wu Xiao-Shan^{1, †,}

(a) The temperature-dependent resistivity from 1.9 K to 400 K, (b) resistivity verses lnT curves for the three samples. If the resistivity obeys the Kondo effect law, the curves would be straight lines.