Effects of Si surficial structure on transport properties of La2/3Sr1/3MnO3 films
Gu Xiao-Min1, Wang Wei2, Zhou Guo-Tai1, Gao Kai-Ge1, Cai Hong-Ling1, Zhang Feng-Ming1, Wu Xiao-Shan1, †,
       

(a) AFM image of the surface of s1; (b) the cross section TEM image of s1; SEM images of (c) s2, and (d) s3 substrate.