Effects of Si surficial structure on transport properties of La
Gu Xiao-Min1, Wang Wei2, Zhou Guo-Tai1, Gao Kai-Ge1, Cai Hong-Ling1, Zhang Feng-Ming1, Wu Xiao-Shan1, †, 
X-ray diffraction patterns at room temperature with a wavelength of 1.5418 Å. Peaks marked with * and # belong to SiO2 layers formed between LSMO and Si. The bumps near (110)/(104) of LSMO may indicate the amorphous structures grown in s2 and s3.
